Total ionizing dose suppression transistor architecture

ABSTRACT

A total ionizing dose suppression architecture for a transistor and a transistor circuit uses an “end cap” metal structure that is connected to the lowest potential voltage to overcome the tendency of negative charge buildup during exposure to ionizing radiation. The suppression architecture uses the field established by coupling the metal structure to the lowest potential voltage to steer the charge away from the critical field (inter-device) and keeps non-local charge from migrating to the “birds-beak” region of the transistor, preventing further charge buildup. The “end cap” structure seals off the “birds-beak” region and isolates the critical area. The critical area charge is source starved of an outside charge. Outside charge migrating close to the induced field is repelled away from the critical region. The architecture is further extended to suppress leakage current between adjacent wells biased to differential potentials.

RELATED APPLICATION

The present application claims priority from, and is a divisional of,U.S. patent application Ser. No. 11/071,730 filed on Mar. 3, 2005. Thedisclosure of the foregoing United States Patent Application isspecifically incorporated herein by this reference in its entirety andassigned to Aeroflex Colorado Springs Inc., assignee of the presentinvention.

FIELD OF THE INVENTION

The present invention relates to a radiation-hardened transistorarchitecture and integrated circuit device.

BACKGROUND OF THE INVENTION

Electrons trapped in high earth orbits and electrons and protons trappedin low and medium earth orbits cause a high level of ionizing radiationin space. Such ionizing radiation causes an accumulation of charge inelectronic circuits which eventually results in a malfunction or failureof the circuits.

Electron-hole pairs generated in the bulk silicon of an integratedcircuit do not present a severe problem, as the electrons and holesrecombine rapidly. Electron-hole pairs formed near the field oxide of anintegrated circuit are more difficult to deal with because the electronsare far more mobile than the holes and may become separated from theholes and trapped near the field oxide interface. This interferes withrecombination and results in an accumulation of net positive charge inthe field oxide, or other dielectric film. The edge region between thediffusion region and the field oxide below a polysilicon gate, referredto as the “bird's beak” region, is particularly susceptible to theeffect of the ionizing radiation. The accumulation of net positivecharge in the field oxide beneath the polysilicon gate can cause leakageof electrons across the gate, turning on the gate prematurely. Evenslight leakage across the many gates in a typical integrated circuit cancause excess power drain and overheating of the integrated circuit.

Integrated circuit designs have been developed to withstand high levelsof ionizing radiation. Such design methodologies can involve redundancyof electronic circuits, suitable doping of the semiconductor materialand spacing of electronic circuits. Such methodologies require increasedcost for redesign and production.

Typical NMOS transistors 100 and 102 are shown in FIG. 1. Transistor 100includes source/drain regions 104 and 108, and polysilicon gate 106.Transistor 102 includes source/drain regions 112 and 114, andpolysilicon gate 116. If one of the source/drain contacts of transistor100 is coupled to ground as shown, and the adjacent source/drain contactof transistor 102 is coupled to VCC as shown, then inter-device leakage110 can occur between the two transistors due to the presence ofionizing radiation. In addition, intra-device leakage 118 can also occurbetween source/drains 112 and 114, if one of the source/drain contactsis coupled to ground, and the other is coupled to VCC, as shown.

An N-channel transistor circuit 200 is shown in FIG. 2A. Transistorcircuit 200 includes two N-channel transistors coupled together,suitable for use in either a NAND or NOR gate. Transistor circuit 200includes a first transistor M1 having a source/drain 202, and a gate204. Transistor circuit 200 also includes a second transistor M2 havinga source/drain 214, and a gate 210. The other source/drains oftransistors M1 and M2 are coupled together at node 208. Body contacts206 and 212 can be coupled to ground. In a NAND gate 220, source/drain202 is coupled to two P-channel transistors as shown in FIG. 2B andsource/drain 214 is coupled to ground. In a NOR gate 230, source/drains202 and 214 are coupled to ground, and node 208 is coupled to twoP-channel transistors as shown in FIG. 2C.

The N-channel transistor circuit 200 is susceptible to intra-device andinter-device leakage currents due to ionizing radiation, just as is asingle N-channel transistor.

One prior art technique for forming a radiation-hardened transistorcircuit 200 is shown in FIG. 3. Two annular transistor circuits areshown, each containing two N-channel transistors as is taught in U.S.Pat. No. 6,570,234 to Gardner, which is hereby incorporated by thisreference. A first transistor circuit device 300 includes source/drainsregions 308, 306, and 304 corresponding to source/drain regions S/D 1,S/D 2, and S/D 3 shown in FIG. 2. Transistor circuit 300 also includesfirst and second annular gates 302 and 310, as well as a thick fieldoxide region 312. A second transistor circuit device 314 includessource/drains regions 324, 322, and 320 corresponding to source/drainregions S/D 1, S/D 2, and S/D 3 shown in FIG. 2. Transistor circuit 314also includes first and second annular gates 318 and 326, as well as athick field oxide region 328.

Transistor circuits 300 and 314 effectively reduce leakage current dueto ionizing radiation. Inter-device leakage current in region 316 iseffectively reduced if source/drain regions 304 and 320 are coupled toground. Additionally, intra-device leakage current along edge 330 iseffectively reduced since both halves of the annular gate “A” 318 are atthe same potential.

While transistor circuits 300 and 314 (and other known annulartransistor and transistor circuit designs known in the art) effectivelyreduce leakage currents induced by ionizing radiation, they do so at theexpense of precious integrated circuit area. Annular gates have foursides, and therefore take up much more area than a standard gate such asthe gates of the prior art transistors shown in FIG. 1.

What is desired, therefore, is a transistor architecture and transistorcircuit device architecture that has the desirable radiation-hardenedcharacteristics of annular designs, but does so in a much smaller area.

SUMMARY OF THE INVENTION

In accordance with an aspect of this invention, a total ionizing dosesuppression architecture for a transistor and a transistor circuit usesan “end cap” metal structure that is connected to ground potentialvoltage to overcome the tendency of negative charge buildup duringexposure to ionizing radiation. The suppression architecture of thepresent invention uses the field established by coupling the metalstructure to ground to steer the charge away from the critical field(inter-device) and keeps non-local charge from migrating to the“birds-beak” region of the transistor, preventing further chargebuildup. The “end cap” structure seals off the “birds-beak” region andisolates the critical area. The critical area charge is source starvedof an outside charge. Outside charge migrating close to the inducedfield is repelled away from the critical region.

In a first embodiment, an N-channel radiation-hardened transistorincludes an active region surrounded by thick oxide, a polysilicon ormetal gate crossing the active region, defining first and secondsource/drain regions, and a metal region coupled to the lowest supplypotential overlapping the boundary of the active region, and completelysurrounding each of the ends of the gate that extends beyond the borderof the active region. The metal region overlapping the boundary of theactive region can be made to completely surround the first end of thegate extending beyond the border of the active region, and completelycover the second end of the gate extending beyond the border of theactive region.

In a second embodiment, a radiation-hardened device includes an activeregion surrounded by thick oxide, first and second polysilicon or metalgates crossing the active region, defining first, second, and thirdsource/drain regions, and a metal region coupled to ground overlappingthe boundary of the active region, and completely surrounding each ofthe ends of the first and second gates that extend beyond the border ofthe active region, wherein the first source/drain region defines thesource/drain region of a first N-channel transistor, the thirdsource/drain region defines the source/drain region of a secondN-channel transistor, and the second source/drain region defines acommon source/drain region for the first and second N-channeltransistors.

In the radiation-hardened device of the second embodiment, either thefirst or third source/drain regions are coupled to the lowest potential,so that the device is suitable for use in a NAND gate. Alternatively, inthe radiation-hardened device of the second embodiment, the first andthird source/drain regions are coupled to ground, so that the device issuitable for use in a NOR gate.

In another embodiment, the radiation-hardened device of the presentinvention can be expanded to include any number N transistors with (N+1)source/drain regions.

The metal region overlapping the boundary of the active region, can bemade to completely surround the first end of the first and second gatesthat extend beyond the border of the active region, and to completelycover the second end of the first and second gates that extend beyondthe border of the active region.

In a multiple-well embodiment one or more N-wells or N+ regions canbecome the effective source/drain while a region of lower supplypotential becomes another source/drain. Metal isolation surroundingthese areas and tied to the lowest voltage potential is used to isolateleakage between the two wells and/or regions.

BRIEF DESCRIPTION OF THE DRAWINGS

The aforementioned and other features and objects of the presentinvention and the manner of attaining them will become more apparent andthe invention itself will be best understood by reference to thefollowing description of a preferred embodiment taken in conjunctionwith the accompanying drawings, wherein:

FIG. 1 is a plan view of two prior art N-channel transistors susceptibleto inter-device and intra-device leakage currents induced by ionizingradiation;

FIG. 2 is a schematic diagram of a prior art N-channel transistorcircuit that is suitable for use in either a NAND gate or a NOR gate;

FIG. 3 is a plan view of two radiation-hardened transistor circuits ofthe type shown in FIG. 2 using an annular transistor structure;

FIG. 4 is a plan view of two radiation-hardened N-channel transistorsaccording to the present invention;

FIG. 5 is a plan view of two radiation-hardened N-channel transistorsaccording to the present invention in which the metal region surroundinga first end of the gates of the first and second transistors has beenextended to completely cover the first end of the gates;

FIG. 6A is a cross-sectional view of one of the transistors shown inFIG. 4 taken along the axis of the polysilicon gate;

FIG. 6B is a cross-sectional view of one of the transistors shown inFIG. 4 taken across the axis of the polysilicon gate;

FIG. 6C is a cross-sectional view of one of the transistors shown inFIG. 5 taken along the axis of the polysilicon gate;

FIG. 7 is a plan view of an N-channel transistor circuit suitable foruse in either a NAND gate or a NOR gate according to the presentinvention;

FIG. 8 is a cross-sectional view of an N-channel transistor and aP-channel transistor in a lightly doped well, as well asradiation-hardening metal regions according to the present invention;

FIG. 9 is a cross-sectional view of an N-channel transistor and aP-channel transistor, both fabricated in lightly doped wells, as well asradiation-hardening metal regions according to the present invention;

FIG. 10 is a cross-sectional view of two P-channel transistors, each ina lightly doped N-type well, including a metal region according to thepresent invention to suppress radiation-induced inter-device leakagecurrent; and

FIG. 11 is a simplified plan view of a metal layout for a small portionof an integrated circuit showing a plurality of N-channel transistorsformed in P-type wells, including the device metal regions according tothe present invention, as well as a plurality of P-channel transistorsformed in N-type wells, in which the device metal regions of theN-channel transistors and the metal traces used to separate theP-channel transistors are joined together for receiving a ground voltageor lowest potential voltage for the purposes of providing optimumradiation hardening, according to the present invention.

DETAILED DESCRIPTION OF THE INVENTION

Referring now to FIG. 4, a plan view of two radiation-hardened N-channeltransistors 402 and 404 is shown according to an embodiment of thepresent invention. A first N-channel radiation-hardened transistor 402includes an active region 406 surrounded by thick oxide, a polysiliconor metal gate 418 crossing the active region 406, defining first andsecond source/drain regions 410 and 414. A metal region 422 is coupledto ground and overlaps the boundary of the active region 406, andcompletely surrounds each of the ends of the gate 418 that extendsbeyond the border of the active region 406. A second N-channelradiation-hardened transistor 404 includes an active region 408surrounded by thick oxide, a polysilicon or metal gate 420 crossing theactive region 408, defining first and second source/drain regions 412and 416. A metal region 424 is coupled to ground and overlaps theboundary of the active region 408, and completely surrounds each of theends of the gate 420 that extends beyond the border of the active region406.

In operation, the charge accumulated from exposure to ionizing radiationis repelled by the field action of the metal regions 422 and 424. Hence,there is no inter-device induced leakage current in area 426.Additionally, the action of the field underneath the metal region 424prevents intra-device leakage current along edge 428. Admittedly, somecharge does develop in the immediate area surrounding the ends of thepolysilicon or metal gates 418 and 420. However, this limited area is“source-starved” and only a minute amount of charge is developed. Thistiny amount of charge is not sufficient to create significant leakagecurrents.

In transistors 402 and 404 it is important to note that the gate extendsbeyond the boundary of the active area 406 and 408 due to processrequirements (typically no contacts are allowed over active gate areas).The gate extends beyond the boundary of the active area onto a thickfield oxide area that completely surrounds the active area. Thus, eitherone or both of the ends of the gate may be contacted. Thecross-sectional views of transistors 402 and 404 is shown in greaterdetail below with respect to FIGS. 6A and 6B.

Referring now to FIG. 5 a plan view of the two radiation-hardenedN-channel transistors 402 and 404 is shown in which the metal region 430surrounding a second end of the gates 418 and 420 has been extended tocompletely cover the first end of the gates. In the embodiment shown inFIG. 5, the second end of gates 418 and 420 are not contacted.Therefore, the gates can be completely covered over with metal area 430.Although metal area 430 is shown as a separate metal region in FIG. 5,it will be understood by those skilled in the art that metal area 430can be merged with metal regions 422 and 424. If desired, therefore, themetal region 422, 424 overlapping the boundary of the active regions406, 408 can be made to completely surround the first end of the gates418, 420 extending beyond the border of the active regions 406, 408, andcompletely cover the second end of the gate extending beyond the borderof the active region. In this way, even the tiny amount of induced fieldoxide charge can be substantially reduced for the gate end that is notcontacted.

Referring now to FIG. 6C, a cross-sectional view 432 of one of thetransistors shown in FIG. 5 is taken along the axis of the polysilicongate. Thus, the semiconductor substrate or epitaxial layer 446 is shown.The gate oxide layer 448 is shown, within the boundary of the activearea, surrounded by thick field oxide layer 438 on both sides. Thepolysilicon or metal gate 418 is shown, which is covered over by oxidelayer 436. The isolating metal region 422 overlapping the active layeris shown, as well as a single contact 440 for providing electricalaccess to gate 418.

Referring now to FIG. 6B is a cross-sectional view 434 of one of thetransistors shown in FIG. 4 or FIG. 5 taken across the axis of thepolysilicon gate. Thus, the semiconductor substrate or epitaxial layer446 is shown, including source/drain regions 410 and 414. The gate oxidelayer 448 is shown, within the boundary of the active area, surroundedby thick field oxide layer 438 on both sides. The polysilicon or metalgate 418 is shown defining the source/drain regions 410 and 414, whichis then all covered over by oxide layer 436. The isolating metal region422 overlapping the active layer is shown, as well as two contacts 442and 444 for providing electrical access to source/drain regions 410 and414.

Referring now to FIG. 7 a plan view of an N-channel transistor circuit700 suitable for use in either a NAND gate or a NOR gate according to asecond embodiment of the present invention. Radiation-hardened device700 includes an active region 702 surrounded by thick oxide, first andsecond polysilicon or metal gates 710 and 712 crossing the active region702 , defining first, second, and third source/drain regions 704, 706,and 708, and a metal region 714 coupled to ground overlapping theboundary of the active region 702, and completely surrounding each ofthe ends of the first and second gates 710 and 712 that extend beyondthe border of the active region 702, wherein the first source/drainregion 704 defines the source/drain region of a first N-channeltransistor, the third source/drain region 708 defines the source/drainregion of a second N-channel transistor, and the second source/drainregion 706 defines a common source/drain region for the first and secondN-channel transistors.

In the radiation-hardened device 700 of the second embodiment, eitherthe first or third source/drain regions 704 and 708 are coupled toground, so that the device is suitable for use in a NAND gate.Alternatively, in the radiation-hardened device 700 of the secondembodiment, the first and third source/drain regions 704 and 708 arecoupled to ground, so that the device is suitable for use in a NOR gate.

If desired, the metal region 714 overlapping the boundary of the activeregion 702, can be made to completely surround the first end of thefirst and second gates 710 and 712 that extend beyond the border of theactive region, and to completely cover the second end of the first andsecond gates 710 and 712 that extend beyond the border of the activeregion, as was shown in FIG. 5.

While the radiation-hardened N-channel transistor and device of thepresent invention addresses the problem of impinging ionizing radiation,these transistors may oftentimes be integrated onto a circuit with otherP-channel transistors fabricated inside of a lightly doped N-type well.If steps are not taken to account for these other transistors, there maybe undesirable leakage current as is explained in further detail below.This problem is exacerbated in integrated circuits in which two or morewell bias voltages are found.

Referring now to FIG. 8, a cross-sectional view 800 of an N-channeltransistor 804 and a P-channel transistor in a lightly doped well 802.To prevent a leakage current flowing from the lightly doped N-type wellto the N+ source/drain regions of the N-channel transistor, it would bedesirable to add metal regions 806. Metal regions 806 are coupled toground or to the lowest potential in the circuit to prevent leakagecurrent due to ionizing radiation. However, in the example shown in FIG.8, if N-channel transistor 804 is fabricated according to the presentinvention, then additional metal regions are not required, since themetal regions associated with transistor 804 itself will be sufficientto stop the leakage current.

Referring now to FIG. 9, a cross-sectional view 900 of an N-channeltransistor 904 and a P-channel transistor 902, both fabricated inlightly doped wells, is shown. N-channel transistor 904 is formed in alightly doped P-type well, and P-channel transistor 902 is formed in alightly doped N-type well. In the example of FIG. 9, there may beleakage current between the wells, even if transistor 904 is fabricatedaccording to the present invention. Therefore, additional protection isrequired to prevent leakage current between transistors formed in thelightly doped wells. This extra protection is provided by metal regions906, which are coupled to ground or to the lowest potential in thecircuit.

Referring now to FIG. 10, a cross-sectional view 1000 of two P-channeltransistors 1004 and 1006 formed in lightly doped N-type wells is shown.The wells are formed in epitaxial layer or substrate 1002 as is known inthe art. In modern semiconductor processes, it is possible that thewells of transistors 1004 and 1006 can be biased to different biasingvoltages. For example, as is shown in FIG. 10, the N-type well oftransistor 1004 is biased to one volt at node or pad 1010, while theN-type well of transistor 1006 is biased to two volts at node or pad1012. To prevent radiation-induced leakage current between the wells inthe area designated 1018, as well as possible leakage currents to othertransistors and wells in the integrated circuit, a metal region 1008 isprovided as shown. Metal region 1008 is coupled to ground or to thelowest voltage in the integrated circuit. It should be noted that theradiation-induced leakage current in area 1018 is similar in effect tothe intra-device leakage current 118 as explained with respect totransistor 102 shown in FIG. 1.

Referring now to FIG. 11, a simplified plan view 1100 of a metal layoutfor a small portion of an integrated circuit is shown. A plurality ofN-channel transistors 1102 formed in P-type wells include ringed metalareas 1106 (not shown in detail in FIG. 11, best shown in FIGS. 4 and 5)according to the present invention. A plurality of P-channel transistors1104A, 1104B, 1104C and 1104D are formed in N-type wells, and areadjacent to the plurality of transistors 1102. Note that the well oftransistor 1104A is biased to one volt at node 1110, and the well oftransistor 1104B is biased to two volts at node 1112. The ringed metalregions 1106 of the N-channel transistors 1102 are joined together withthe metal regions 1108 used to isolate the P-channel transistors 1104A-Dfor receiving a ground or lowest potential voltage at node 1114 for thepurposes of providing optimum radiation hardening. The metal schemeshown in FIG. 11 can be expanded to an entire integrated circuit devicefor the purpose of virtually eliminating all possible paths ofradiation-induced inter-device and intra-device leakage currents betweenand within transistors, whether formed in a well, or directly in theepitaxial layer or substrate.

Although illustrative embodiments of the present invention, and variousmodifications thereof, have been described in detail herein withreference to the accompanying drawings, it is to be understood that theinvention is not limited to these embodiments and the describedmodifications, and that various changes and further modifications may beeffected therein by one skilled in the art without departing from thescope or spirit of the invention, which is defined in the claims, below.

1. A radiation-hardened integrated circuit, comprising: an N-channeltransistor having a first metal region directly disposed on a topsurface thereof overlapping the boundary of an active region andcompletely surrounding each of the ends of a gate that extends beyondthe border of the active region; a P-channel transistor in a lightlydoped well; and a second metal region interposed between the N-channeltransistor and the P-channel transistor coupled to ground or to thelowest potential in the integrated circuit to prevent leakage currentdue to ionizing radiation.
 2. A radiation-hardened integrated circuit,comprising: an N-channel transistor in a lightly doped P-type wellhaving a first metal region directly disposed on a top surface thereofoverlapping the boundary of an active region and completely surroundingeach of the ends of a gate that extends beyond the border of the activeregion; a P-channel transistor in a lightly doped N-type well; and asecond metal region interposed between the N-channel transistor and theP-channel transistor coupled to ground or to the lowest potential in theintegrated circuit to prevent leakage current due to ionizing radiation.3. A radiation-hardened integrated circuit as in claim 2, comprising: aplurality of N-channel transistors in P-type wells; and a plurality ofP-channel transistors in N-type wells.